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Details for article 21 of 43 found articles
| Title: |
NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering |
| Author: |
Allen, Andrew J. Zhang, Fan Kline, R. Joseph Guthrie, William F. Ilavsky, Jan |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 50 (2017) nr. 2 pages 462-474 |
| Year: |
2017-04-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 43 found articles
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