|
Quasi-fivefold symmetric electron diffraction patterns due to multiple twinning in silicon thin films grown from hexamethyldisiloxane |
|
|
|
Titel: |
Quasi-fivefold symmetric electron diffraction patterns due to multiple twinning in silicon thin films grown from hexamethyldisiloxane |
Auteur: |
Haddad, Farah Goyal, Prabal Johnson, Erik V. Hong, Junegie Roca i Cabarrocas, Pere Maurice, Jean-Luc |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 49 (2016) nr. 6 pagina's 2226-2234 |
Jaar: |
2016-02-01 |
Inhoud: |
|
Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
|
|
|
|