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Details for article 2 of 47 found articles
| Title: |
A synchrotron X-ray diffraction deconvolution method for the measurement of residual stress in thermal barrier coatings as a function of depth |
| Author: |
Li, C. Jacques, S. D. M. Chen, Y. Daisenberger, D. Xiao, P. Markocsan, N. Nylen, P. Cernik, R. J. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 49 (2016) nr. 6 pages 1904-1911 |
| Year: |
2016-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 47 found articles
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