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An advanced three-dimensional RHEED mapping approach to the diffraction study of Co/MnF2/CaF2/Si(001) epitaxial heterostructures |
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Titel: |
An advanced three-dimensional RHEED mapping approach to the diffraction study of Co/MnF2/CaF2/Si(001) epitaxial heterostructures |
Auteur: |
Suturin, S. M. Korovin, A. M. Fedorov, V. V. Valkovsky, G. A. Tabuchi, M. Sokolov, N. S. |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 49 (2016) nr. 5 pagina's 1532-1543 |
Jaar: |
2016-00-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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