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Details for article 17 of 46 found articles
| Title: |
Hybrid reciprocal lattice: application to layer stress determination in GaAlN/GaN(0001) systems with patterned substrates |
| Author: |
Domagała, Jarosław Z. Morelhão, Sérgio L. Sarzyński, Marcin Maździarz, Marcin Dłużewski, Paweł Leszczyński, Michał |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 49 (2016) nr. 3 pages 798-805 |
| Year: |
2016-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 46 found articles
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