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Removing multiple outliers and single-crystal artefacts from X-ray diffraction computed tomography data |
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Titel: |
Removing multiple outliers and single-crystal artefacts from X-ray diffraction computed tomography data |
Auteur: |
Vamvakeros, Antonios Jacques, Simon D. M. Di Michiel, Marco Middelkoop, Vesna Egan, Christopher K. Cernik, Robert J. Beale, Andrew M. |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 48 (2015) nr. 6 pagina's 1943-1955 |
Jaar: |
2015-02-01 |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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