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Journal description
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Details for article 19 of 29 found articles
| Title: |
Representational analysis of extended disorder in atomistic ensembles derived from total scattering data |
| Author: |
Neilson, James R. McQueen, Tyrel M. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 48 (2015) nr. 5 pages 1560-1572 |
| Year: |
2015-00-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 29 found articles
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