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Laue pattern analysis for two-dimensional strain mapping in light-ion-implanted polycrystals |
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Title: |
Laue pattern analysis for two-dimensional strain mapping in light-ion-implanted polycrystals |
Author: |
Ibrahim, M. Castelier, É. Palancher, H. Bornert, M. Caré, S. Micha, J.-S. |
Appeared in: |
Journal of applied crystallography |
Paging: |
Volume 48 (2015) nr. 4 pages 990-999 |
Year: |
2015-08-01 |
Contents: |
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Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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