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X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient |
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Titel: |
X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient |
Auteur: |
Kocharyan, V. R. Gogolev, A. S. Movsisyan, A. E. Beybutyan, A. H. Khlopuzyan, S. G. Aloyan, L. R. |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 48 (2015) nr. 3 pagina's 853-856 |
Jaar: |
2015-06-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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