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Journal description
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Details for article 40 of 40 found articles
| Title: |
Traceable GISAXS measurements for pitch determination of a 25 nm self-assembled polymer grating |
| Author: |
Wernecke, Jan Krumrey, Michael Hoell, Armin Kline, R. Joseph Liu, Hung-Kung Wu, Wen-Li |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 47 (2014) nr. 6 pages 1912-1920 |
| Year: |
2014-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 40 of 40 found articles
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