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Details for article 2 of 38 found articles
| Title: |
Analysis of crystalline perfection of pure and Mo-doped KTP crystals on different growth planes by high-resolution X-ray diffraction |
| Author: |
Rajeev Gandhi, Jayavelu Rathnakumari, Muthian Muralimanohar, Pandarinathan Sureshkumar, Palanivel Bhagavannarayana, Godavarthi |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 47 (2014) nr. 3 pages 931-935 |
| Year: |
2014-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 38 found articles
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