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Details for article 21 of 62 found articles
| Title: |
Diffraction stress analysis of highly planar-faulted, macroscopically elastically anisotropic thin films and application to tensilely loaded nanocrystalline Ni and Ni(W) |
| Author: |
Kurz, Silke Julia Birgit Welzel, Udo Bischoff, Ewald Mittemeijer, Eric Jan |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 47 (2014) nr. 1 pages 291-302 |
| Year: |
2014-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 62 found articles
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