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Details for article 1 of 37 found articles
| Title: |
Accurate determination of surface orientation of single-crystal wafers using high-resolution X-ray rocking curve measurements |
| Author: |
Kim, Chang Soo Bin, Seok Min Jeon, Hyeon-Gu O, Byungsung Choi, Young Dae |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 46 (2013) nr. 5 pages 1298-1305 |
| Year: |
2013-00-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 37 found articles
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