|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 11 of 56 found articles
| Title: |
Characterization of SiGe thin films using a laboratory X-ray instrument |
| Author: |
Ulyanenkova, Tatjana Myronov, Maksym Benediktovitch, Andrei Mikhalychev, Alexander Halpin, John Ulyanenkov, Alex |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 46 (2013) nr. 4 pages 898-902 |
| Year: |
2013-08-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 56 found articles
| << previous | next >> |