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Details for article 26 of 36 found articles
| Title: |
Sin2ψ-based residual stress gradient analysis by energy-dispersive synchrotron diffraction constrained by small gauge volumes. I. Theoretical concept |
| Author: |
Meixner, M. Klaus, M. Genzel, Ch. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 46 (2013) nr. 3 pages 610-618 |
| Year: |
2013-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 26 of 36 found articles
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