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Details for article 12 of 36 found articles
| Title: |
Contrast enhancement of data measured with area detectors: a way to generalize the use of neutron diffraction for thin-film studies |
| Author: |
Bataille, Alexandre M. Auvray, Vincent Gatel, Christophe Gukasov, Arsen |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 46 (2013) nr. 3 pages 726-735 |
| Year: |
2013-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 36 found articles
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