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Details for article 10 of 39 found articles
| Title: |
Comprehensive synchrotron grazing-incidence X-ray scattering analysis of nanostructures in porous polymethylsilsesquioxane dielectric thin films |
| Author: |
Rho, Yecheol Ahn, Byungcheol Yoon, Jinhwan Ree, Moonhor |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 46 (2013) nr. 2 pages 466-475 |
| Year: |
2013-04-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 39 found articles
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