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  Diffraction/scattering computed tomography for three-dimensional characterization of multi-phase crystalline and amorphous materials
 
 
Title: Diffraction/scattering computed tomography for three-dimensional characterization of multi-phase crystalline and amorphous materials
Author: Álvarez-Murga, M.
Bleuet, P.
Hodeau, J.-L.
Appeared in: Journal of applied crystallography
Paging: Volume 45 (2012) nr. 6 pages 1109-1124
Year: 2012-02-01
Contents:
Publisher: International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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