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Details for article 2 of 32 found articles
| Title: |
A fast methodology to determine the characteristics of thousands of grains using three-dimensional X-ray diffraction. I. Overlapping diffraction peaks and parameters of the experimental setup |
| Author: |
Sharma, Hemant Huizenga, Richard M. Offerman, S. Erik |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 45 (2012) nr. 4 pages 693-704 |
| Year: |
2012-08-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 32 found articles
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