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Details for article 12 of 30 found articles
| Title: |
Evidence for correlated structural and electrical changes in a Ge2Sb2Te5 thin film from combined synchrotron X-ray techniques and sheet resistance measurements during in situ thermal annealing |
| Author: |
Putero, Magali Ouled-Khachroum, Toufik Coulet, Marie-Vanessa Deleruyelle, Damien Ziegler, Eric Muller, Christophe |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 44 (2011) nr. 4 pages 858-864 |
| Year: |
2011-08-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 30 found articles
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