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                                       Details for article 3 of 24 found articles
 
 
  Application of synchrotron-based reciprocal-space mapping at a fixed angular position to identification of crystal symmetry of Bi4Ti3O12 epitaxial thin films
 
 
Title: Application of synchrotron-based reciprocal-space mapping at a fixed angular position to identification of crystal symmetry of Bi4Ti3O12 epitaxial thin films
Author: Sakata, Osami
Watanabe, Takayuki
Funakubo, Hiroshi
Appeared in: Journal of applied crystallography
Paging: Volume 44 (2011) nr. 2 pages 385-391
Year: 2011-04-01
Contents:
Publisher: International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 24 found articles
 
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