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Details for article 10 of 24 found articles
| Title: |
Measuring the linearity of X-ray detectors: consequences for absolute attenuation, scattering and absolute Bragg intensities |
| Author: |
Barnea, Zwi Chantler, Christopher T. Glover, Jack L. Grigg, Mark W. Islam, M. Tauhidul de Jonge, Martin D. Rae, Nicholas A. Tran, Chanh Q. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 44 (2011) nr. 2 pages 281-286 |
| Year: |
2011-04-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 24 found articles
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