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Details for article 9 of 33 found articles
| Title: |
Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction |
| Author: |
Chamard, Virginie Stangl, Julian Labat, Stephane Mandl, Bernhard Lechner, Rainer T. Metzger, Till H. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 41 (2008) nr. 2 pages 272-280 |
| Year: |
2008-04-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 33 found articles
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