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Structural characterization using the multiple scattering effects in grazing-incidence small-angle X-ray scattering |
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Titel: |
Structural characterization using the multiple scattering effects in grazing-incidence small-angle X-ray scattering |
Auteur: |
Lee, Byeongdu Lo, Chieh-Tsung Thiyagarajan, P. Lee, Dong R. Niu, Zhongwei Wang, Qian |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 41 (2008) nr. 1 pagina's 134-142 |
Jaar: |
2008-02-01 |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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