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Details for article 26 of 38 found articles
| Title: |
Quantitative analysis of lamellar structures in brush polymer thin films by synchrotron grazing-incidence X-ray scattering |
| Author: |
Yoon, Jinhwan Jin, Kyeong Sik Kim, Hyun Chul Kim, Gahee Heo, Kyuyoung Jin, Sangwoo Kim, Jehan Kim, Kwang-Woo Ree, Moonhor |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 40 (2007) nr. 3 pages 476-488 |
| Year: |
2007-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 26 of 38 found articles
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