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Journal description
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Details for article 15 of 22 found articles
| Title: |
Si wafers having one- and two-dimensionally curved (111) planes examined by X-ray diffraction |
| Author: |
Okuda, Hiroshi Nakajima, Kazuo Fujiwara, Kozo Ochiai, Shojiro |
| Appeared in: |
Applied crystallography online |
| Paging: | Volume 39 (2006) nr. 3 pages 443-445 |
| Year: |
2006-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 22 found articles
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