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Journal description
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Details for article 11 of 20 found articles
| Title: |
On the sensitivity of electron and X-ray scattering factors to valence charge distributions |
| Author: |
Zheng, Jin-Cheng Zhu, Yimei Wu, Lijun Davenport, James W. |
| Appeared in: |
Applied crystallography online |
| Paging: | Volume 38 (2005) nr. 4 pages 648-656 |
| Year: |
2005-08-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 20 found articles
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