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Characterization of ordered mesoporous films on silicon (001) surface using X-ray and electron diffraction |
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Title: |
Characterization of ordered mesoporous films on silicon (001) surface using X-ray and electron diffraction |
Author: |
Liu, Pang-Hung Chao, Kuei-Jung Guo, Xing-Jian Huang, Kuo-Ying Lee, Yen-Ru Cheng, Cheng-Wen Chiu, Mau-Sen Chang, Shih-Lin |
Appeared in: |
Journal of applied crystallography |
Paging: |
Volume 38 (2005) nr. 1 pages 211-216 |
Year: |
2005-02-01 |
Contents: |
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Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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