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                                       Details for article 8 of 31 found articles
 
 
  Characterization of ordered mesoporous films on silicon (001) surface using X-ray and electron diffraction
 
 
Title: Characterization of ordered mesoporous films on silicon (001) surface using X-ray and electron diffraction
Author: Liu, Pang-Hung
Chao, Kuei-Jung
Guo, Xing-Jian
Huang, Kuo-Ying
Lee, Yen-Ru
Cheng, Cheng-Wen
Chiu, Mau-Sen
Chang, Shih-Lin
Appeared in: Journal of applied crystallography
Paging: Volume 38 (2005) nr. 1 pages 211-216
Year: 2005-02-01
Contents:
Publisher: International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 31 found articles
 
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