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Journal description
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Details for article 3 of 35 found articles
| Title: |
A new method for the determination of strain profiles in epitaxic thin films using X-ray diffraction |
| Author: |
Boulle, A. Masson, O. Guinebretière, R. Dauger, A. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 36 (2003) nr. 6 pages 1424-1431 |
| Year: |
2003-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 35 found articles
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