|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 9 of 27 found articles
| Title: |
Measurement of subtle strain modifications in heterostructures by using X-ray mapping in reciprocal space |
| Author: |
Shilo, D. Lakin, E. Zolotoyabko, E. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 34 (2001) nr. 6 pages 715-721 |
| Year: |
2001-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 27 found articles
| << previous | next >> |