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Journal description
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Details for article 5 of 27 found articles
| Title: |
Direct determination of microstructural parameters from the X-ray diffraction profile of a crystal with stacking faults |
| Author: |
Estevez-Rams, Ernesto Penton-Madrigal, Arbelio Lora-Serrano, Raymundo Martinez-Garcia, Jorge |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 34 (2001) nr. 6 pages 730-736 |
| Year: |
2001-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 27 found articles
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