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Journal description
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Details for article 3 of 35 found articles
| Title: |
Calculation of diffraction line profiles from specimens with dislocations. A comparison of analytical models with computer simulations |
| Author: |
Kamminga, J.-D. Delhez, R. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 33 (2000) nr. 4 pages 1122-1127 |
| Year: |
2000-08-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 35 found articles
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