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Details for article 20 of 25 found articles
| Title: |
Resonant X-ray diffraction using high-resolution image-plate data |
| Author: |
Ehrenberg, H. Knapp, M. Hartmann, T. Fuess, H. Wroblewski, T. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 33 (2000) nr. 3-2 pages 953-957 |
| Year: |
2000-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 25 found articles
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