|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 47 of 106 found articles
| Title: |
Micro-focus X-ray scanning on layers of smectic superstructures |
| Author: |
Gurke, I. Wutz, C. Gieseler, D. Janssens, B. Heidelbach, F. Riekel, C. Kricheldorf, H.R. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 33 (2000) nr. 3-1 pages 718-722 |
| Year: |
2000-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 47 of 106 found articles
| << previous | next >> |