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Journal description
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Details for article 25 of 29 found articles
| Title: |
Study of the influence of oxygen on structural perfection of silicon single crystals by high-resolution X-ray diffraction and infrared absorption measurements |
| Author: |
Lal, Krishan Ramanan, R. R. Bhagavannarayana, G. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 33 (2000) nr. 1 pages 2-9 |
| Year: |
2000-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 29 found articles
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