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Journal description
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Details for article 19 of 23 found articles
| Title: |
Structural properties of p+-type porous silicon layers versus the substrate orientation: an X-ray diffraction comparative study |
| Author: |
Faivre, C. Bellet, D. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 32 (1999) nr. 6 pages 1134-1144 |
| Year: |
1999-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 23 found articles
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