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Effect of Thermal Diffuse Scattering in Triple-Crystal Diffractometry with High-Energy Synchrotron Radiation |
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Titel: |
Effect of Thermal Diffuse Scattering in Triple-Crystal Diffractometry with High-Energy Synchrotron Radiation |
Auteur: |
Schmidt, T. Woo, D. Keitel, S. Schneider, J. R. Lambert, U. Zulehner, W. |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 31 (1998) nr. 4 pagina's 625-633 |
Jaar: |
1998-08-01 |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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