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Journal description
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Details for article 29 of 29 found articles
| Title: |
X-ray Rietveld Analysis with a Physically Based Background |
| Author: |
Riello, P. Fagherazzi, G. Clemente, D. Canton, P. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 28 (1995) nr. 2 pages 115-120 |
| Year: |
1995-04-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 29 of 29 found articles
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