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Journal description
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Details for article 41 of 42 found articles
| Title: |
X-ray texture analysis of thin films by the reflection method: intermediate regime in defocusing corrections |
| Author: |
Chateigner, D. Germi, P. Pernet, M. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 27 (1994) nr. 3 pages 278-282 |
| Year: |
1994-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 41 of 42 found articles
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