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Details for article 14 of 25 found articles
| Title: |
High-resolution X-ray diffraction of molecular-beam-epitaxy-grown InAlAs/InGaAs/InAlAs three-layer structures on (001)-oriented InP substrates |
| Author: |
Brühl, H.-G. Poecker, A. Nickel, H. Lösch, R. Schlapp, W. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 26 (1993) nr. 5 pages 645-649 |
| Year: |
1993-00-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 25 found articles
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