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Details for article 16 of 39 found articles
| Title: |
Evidence of a lamellar microstructure in β-FeSi2 thin films grown on Si(111) by solid-phase epitaxy: a transmission electron microscopy analysis |
| Author: |
Zheng, Y. Taccoen, A. Gandais, M. Pétroff, J. F. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 26 (1993) nr. 3 pages 388-395 |
| Year: |
1993-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 39 found articles
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