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Journal description
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Details for article 9 of 30 found articles
| Title: |
Grazing-incidence X-ray diffraction on ion-implanted silicon |
| Author: |
Rugel, S. Wallner, G. Metzger, H. Peisl, J. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 26 (1993) nr. 1 pages 34-40 |
| Year: |
1993-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 30 found articles
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