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Journal description
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Details for article 23 of 30 found articles
| Title: |
Stuctural and chemical analysis of materials. X-ray, electron, and neutron diffraction; X-ray, electron, and ion spectrometry; electron microscopy by J. P. Eberhart |
| Author: |
Thomas, N. W. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 26 (1993) nr. 1 pages 145-146 |
| Year: |
1993-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 23 of 30 found articles
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