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Journal description
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Details for article 13 of 20 found articles
| Title: |
Profile agreement indices in Rietveld and pattern-fitting analysis |
| Author: |
Hill, R. J. Fischer, R. X. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 23 (1990) nr. 6 pages 462-468 |
| Year: |
1990-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 20 found articles
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