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Journal description
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Details for article 7 of 18 found articles
| Title: |
Easy derivation of the formula relating the fluctuations of a binary system to the X-ray scattering intensity extrapolated to s = 0 |
| Author: |
Hayashi, H. Nishikawa, K. Iijima, T. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 23 (1990) nr. 2 pages 134-135 |
| Year: |
1990-04-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 18 found articles
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