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Journal description
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Details for article 10 of 28 found articles
| Title: |
High-speed X-ray diffraction and in situ resistivity measurements at temperatures of 100 to 1000 K |
| Author: |
Angilello, J. Thompson, R. D. Tu, K. N. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 22 (1989) nr. 6 pages 523-527 |
| Year: |
1989-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 28 found articles
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