The recording and analysis of synchrotron X-radiation Laue diffraction photographs
Titel:
The recording and analysis of synchrotron X-radiation Laue diffraction photographs
Auteur:
Helliwell, J. R. Habash, J. Cruickshank, D. W. J. Harding, M. M. Greenhough, T. J. Campbell, J. W. Clifton, I. J. Elder, M. Machin, P. A. Papiz, M. Z. Zurek, S.
Verschenen in:
Journal of applied crystallography
Paginering:
Jaargang 22 (1989) nr. 5 pagina's 483-497
Jaar:
1989-00-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England