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An X-ray diffractometer for studying the effect of external fields on the structure and electron distribution of single crystals |
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Titel: |
An X-ray diffractometer for studying the effect of external fields on the structure and electron distribution of single crystals |
Auteur: |
Aslanov, L. A. Trunov, V. A. Fetisov, G. V. Priemyshev, V. A. Rybakov, V. B. Kasman, Ya. A. Bulkin, A. P. |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 22 (1989) nr. 1 pagina's 42-45 |
Jaar: |
1989-02-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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