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Journal description
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Details for article 14 of 18 found articles
| Title: |
Truncation in diffraction pattern analysis. I. Concept of a diffraction line profile and its range |
| Author: |
Delhez, R. de Keijser, Th. Mittemeijer, E. J. Langford, J. I. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 19 (1986) nr. 6 pages 459-466 |
| Year: |
1986-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 18 found articles
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