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Journal description
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Details for article 3 of 23 found articles
| Title: |
Calculation of diffraction line profiles in the case of coupled stacking fault and size-effect broadening: application to boehmite AlOOH |
| Author: |
Grebille, D. Bérar, J. F. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 19 (1986) nr. 4 pages 249-254 |
| Year: |
1986-08-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 23 found articles
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